SEE111 MEMS Wafer Sort Tester

Product Features

• ☆ High temperature control accuracy: Temperature fluctuation within ±0.5℃ across the entire range.
• ☆ Multi-station parallel testing + matrix pick-and-place: significantly higher efficiency than traditional single-station equipment
• ☆ Highly compatible: supports MEMS chip testing across multiple specifications and package types.
• ☆ Precise pick-and-place positioning prevents damage to chip appearance and functionality.